Journals Radiohobby 2008 Service manuals, schematics, documentation, programs, datasheets, electronics

Minimizing layout hot spots at the 45-nm node
As technology migrates from 90 nm to 65 nm and, eventually, to the 45-nm node, fast yield ramp-up is increasingly difficult to achieve due to the sub-wavelength effects of lithography. Details... more »

 

Connect the dots
The problem with asset lite and foundries Details... more »

 

ST loses $758M in quarter
STMicroelectronics posted a huge loss in the second quarter due to a one-time charge related to the spin off of its flash memory business in a joint venture with Intel and the Francisco Partners. Revenue dropped from the year-ago quarter but improved from the first quarter on higher wireless and consumer sales. Details... more »